Aufsatz in einer Fachzeitschrift
Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy
Details zur Publikation
Autor(inn)en: | Johnson, S.; Heimann, P.; Lindenberg, A.; Jeschke, H.; Garcia, M.; Chang, Z.; Lee, R.; Rehr, J.; Falcone, R. |
Verlag: | AMER PHYSICAL SOC |
Publikationsjahr: | 2003 |
Zeitschrift: | Physical Review Letters |
Seitenbereich: | 1-4 |
Abkürzung der Fachzeitschrift: | PRL |
Jahrgang/Band : | 91 |
Heftnummer: | 15 |
Seitenumfang: | 4 |
ISSN: | 0031-9007 |
eISSN: | 1079-7114 |
DOI-Link der Erstveröffentlichung: |
Zusammenfassung, Abstract
Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.
Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.
