Journal article
Telecom-wavelength (1.5 µm) single-photon emission from InP-based quantum dots
Publication Details
Authors: | Benyoucef, M.; Yacob, M.; Reithmaier, J.; Kettler, J.; Michler, P. |
Publisher: | AMER INST PHYSICS |
Publication year: | 2013 |
Journal: | Applied Physics Letters |
Pages range : | 162101 |
Volume number: | 103 |
Issue number: | 16 |
Number of pages: | 4 |
ISSN: | 0003-6951 |
DOI-Link der Erstveröffentlichung: |
Abstract
We demonstrate pronounced single-photon emission from InAs/AlGaInAs/InP quantum dots (QDs) at wavelengths above 1.5 mu m that are compatible with standard long-distance fiber communication. The QDs are grown by molecular beam epitaxy on distributed Bragg reflectors. A low QD density of about 5 x 10(8) cm(-2) was obtained using optimized growth conditions. Low-temperature micro-photoluminescence spectroscopy exhibits sharp excitonic emission lines from single QDs without the necessity of further processing steps. The combination of excitation power-dependent and polarization-resolved photoluminescence measurements reveal a characteristic exciton-biexciton behavior with biexciton binding energies that range from 3.5 to 4 meV and fine-structure splitting values down to 20 mu eV. (C) 2013 AIP Publishing LLC.
We demonstrate pronounced single-photon emission from InAs/AlGaInAs/InP quantum dots (QDs) at wavelengths above 1.5 mu m that are compatible with standard long-distance fiber communication. The QDs are grown by molecular beam epitaxy on distributed Bragg reflectors. A low QD density of about 5 x 10(8) cm(-2) was obtained using optimized growth conditions. Low-temperature micro-photoluminescence spectroscopy exhibits sharp excitonic emission lines from single QDs without the necessity of further processing steps. The combination of excitation power-dependent and polarization-resolved photoluminescence measurements reveal a characteristic exciton-biexciton behavior with biexciton binding energies that range from 3.5 to 4 meV and fine-structure splitting values down to 20 mu eV. (C) 2013 AIP Publishing LLC.
