Conference proceedings article
Extended approach to selecting a project-specific reliability growth model
Publication Details
Authors: | Krini, J.; Krini, A.; Krini, O.; Börcsök, J. |
Editor: | IEEE |
Publication year: | 2016 |
Pages range : | 1179-1184 |
Book title: | 2016 39th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) |
ISBN: | 978-953-233-086-1 |
DOI-Link der Erstveröffentlichung: |
